Demostration of Silicon-on-insulator mid-infrared spectrometers operating at 3.8 µm

08.27.13 //

Authors: M. Muneeb, X. Chen, P. Verheyen, G. Lepage, S. Pathak, E. Ryckeboer, A. Malik, B. Kuyken, M. Nedeljkovic, J. Van Campenhout, G. Z. Mashanonich, G. Roelkens

Journal: OSA Vol. 21, No. 10/ DOI: 10.1364/OE.21.011659